A valence Auger analysis across the annealed interface between a deposited titanium film and sapphire | Tokyo Tech Research Repository (T2R2)

Publication Information

Title

Japanese:
English:	A valence Auger analysis across the annealed interface between a deposited titanium film and sapphire

Author

Japanese:	高橋邦夫.
English:	KUNIO TAKAHASHI.

Language

English

Journal/Book name

Japanese:
English:	Thin Solid Films

Volume, Number, Page

Vol. 216 pp. 239-243

Published date

1992

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

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