Reliability of Single Electron Transistor Circuits Based on Eb/No-Bit Error Rate Characteristics

Publication Information

Title

Japanese:
English:	Reliability of Single Electron Transistor Circuits Based on Eb/No-Bit Error Rate Characteristics

Author

Japanese:	S. Shimano, K. Masu, K. Tsubouchi.
English:	S. Shimano, K. Masu, K. Tsubouchi.

Language

English

Journal/Book name

Japanese:
English:	Jpn. J. Appl. Phys.

Volume, Number, Page

Vol. 38 No. 1B pp. 403-405

Published date

1999

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: