Reliability of SET Circuits Based on Eb/No-BER Characteristics

Publication Information

Title

Japanese:
English:	Reliability of SET Circuits Based on Eb/No-BER Characteristics

Author

Japanese:	S. Shimano, K. Masu, K. Tsubouchi.
English:	S. Shimano, K. Masu, K. Tsubouchi.

Language

English

Journal/Book name

Japanese:
English:	1998 International Symposium on Formation, Physics and Device Application of Quantum Dot Structures (QDS '98)

Volume, Number, Page

pp. 16

Published date

1998

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: