Concurrent x-ray diffractometer for high throughput stractural diagnosis of epitaxial thin films

Publication Information

Title

Japanese:
English:	Concurrent x-ray diffractometer for high throughput stractural diagnosis of epitaxial thin films

Author

Japanese:	M. Ohtani, T. Fukumura, M. Kawasaki, K. Omote, T. Kikuchi, J. Harada, A. Ohtomo, M. Lippmaa, T. Ohnishi, D. Komiyama, R. Takahashi, Y. Matsumoto, H. Koinuma.
English:	M. Ohtani, T. Fukumura, M. Kawasaki, K. Omote, T. Kikuchi, J. Harada, A. Ohtomo, M. Lippmaa, T. Ohnishi, D. Komiyama, R. Takahashi, Y. Matsumoto, H. Koinuma.

Language

English

Journal/Book name

Japanese:
English:	Appl. Phys. Lett.

Volume, Number, Page

Vol. 79 pp. 3594-3596

Published date

2001

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: