Structre Analysis of the As-deposited Si(100) Surface Using Grazing-Angle X-ray Standing Waves | Tokyo Tech Research Repository (T2R2)

Publication Information

Title

Japanese:
English:	Structre Analysis of the As-deposited Si(100) Surface Using Grazing-Angle X-ray Standing Waves

Author

Japanese:	坂田修身　.
English:	OSAMI SAKATA.

Language

English

Journal/Book name

Japanese:
English:	Report of RLEMTIT,Tokyo Inst,ofTechnology

Volume, Number, Page

Vol. 21 pp. 37-41

Published date

1996

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

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