Anomalous dispersion X-ray reflectometry for model-independent determination of Al/C multilayer structures | Science Tokyo Research Repository (T2R2)

Publication Information

Title

Japanese:
English:	Anomalous dispersion X-ray reflectometry for model-independent determination of Al/C multilayer structures

Author

Japanese:	坂田修身　.
English:	OSAMI SAKATA.

Language

English

Journal/Book name

Japanese:
English:	Physica B

Volume, Number, Page

Vol. 221 pp. 416-419

Published date

1996

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

©2007 Institute of Science Tokyo All rights reserved.