Inter-facial roughness of Si┣D21-X┫D2 Gex/Si multilayer structures on Si(111) probed by X-ray scatlering | Tokyo Tech Research Repository (T2R2)

Publication Information

Title

Japanese:
English:	Inter-facial roughness of Si┣D21-X┫D2 Gex/Si multilayer structures on Si(111) probed by X-ray scatlering

Author

Japanese:	坂田修身　.
English:	OSAMI SAKATA.

Language

English

Journal/Book name

Japanese:
English:	J. Phys. : Condens. Matter

Volume, Number, Page

Vol. 9 pp. 4521-4533

Published date

1997

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

©2007 Tokyo Institute of Technology All rights reserved.