Criterion for Electrostatic Detachment of an Adhering Microparticle

Publication Information

Title

Japanese:
English:	Criterion for Electrostatic Detachment of an Adhering Microparticle

Author

Japanese:	Shigeki Saito, Hideo Himeno, Kunio Takahashi, Tadao Onzawa.
English:	Shigeki Saito, Hideo Himeno, Kunio Takahashi, Tadao Onzawa.

Language

English

Journal/Book name

Japanese:
English:	Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show

Volume, Number, Page

Vol. 3 pp. 98-101

Published date

2003

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: