High-Crosstalk Robustness Transmission Line Interconnect in Si LSI using Zero-Crosstalk Structure

Publication Information

Title

Japanese:
English:	High-Crosstalk Robustness Transmission Line Interconnect in Si LSI using Zero-Crosstalk Structure

Author

Japanese:	Makoto Kimura, Hiroyuki Ito, Hideyuki Sugita, Kenichi Okada, Kazuya Masu.
English:	Makoto Kimura, Hiroyuki Ito, Hideyuki Sugita, Kenichi Okada, Kazuya Masu.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

pp. 153-156

Published date

May 2006

Publisher

Japanese:
English:

Conference name

Japanese:
English:	IEEE Workshop on Signal Propagation on Interconnects

Conference site

Japanese:
English:	Berlin-Mitte, Germany