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Publication Information
Title
Japanese:
English:
Yield Estimation Considering Via Defects
Author
Japanese:
Takumi Uezono, Kenichi Okada,
Kazuya Masu
.
English:
Takumi Uezono, Kenichi Okada,
Kazuya Masu
.
Language
English
Journal/Book name
Japanese:
English:
Volume, Number, Page
pp. 201-206
Published date
Apr. 2006
Publisher
Japanese:
English:
Conference name
Japanese:
English:
The Workshop on Synthesis And System Integration of Mixed Information Technologies
Conference site
Japanese:
English:
名古屋
©2007
Tokyo Institute of Technology All rights reserved.