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Publication Information
Title
Japanese:
MOSFETのサブスレッショルド電流ばらつき測定のための回路検討
English:
Author
Japanese:
藤久 雄己,
岡田 健一
,
佐藤 高史
, 中山 範明,
益 一哉
.
English:
藤久 雄己,
Kenichi Okada
,
Takashi Sato
, 中山 範明,
Kazuya Masu
.
Language
Japanese
Journal/Book name
Japanese:
English:
Volume, Number, Page
pp. 259-262
Published date
Nov. 2006
Publisher
Japanese:
English:
Conference name
Japanese:
電子情報通信学会 システムLSIワークショップ
English:
Conference site
Japanese:
北九州国際会議場
English:
©2007
Tokyo Institute of Technology All rights reserved.