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Title
Japanese:デバイスばらつき測定用電源構造の改善 
English: 
Author
Japanese: 萩原汐, 佐藤高史, 益一哉.  
English: 萩原汐, Takashi Sato, Kazuya Masu.  
Language Japanese 
Journal/Book name
Japanese: 
English: 
Volume, Number, Page        
Published date Sept. 2006 
Publisher
Japanese: 
English: 
Conference name
Japanese:VDECデザイナーフォーラム 
English: 
Conference site
Japanese:高知 
English: 

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