デザインパターン検出のためのテストケース作成支援

Publication Information

Title

Japanese:	デザインパターン検出のためのテストケース作成支援
English:	Test Case Generation for Design Pattern Detection

Author

Japanese:	坂本良太, 林晋平, 佐伯元司.
English:	Ryota Sakamoto, Shinpei Hayashi, Motoshi Saeki.

Language

Japanese

Journal/Book name

Japanese:	電子情報通信学会技術研究報告
English:	IEICE Technical Report

Volume, Number, Page

Vol. 106 No. 16 pp. 7-12

Published date

Apr. 2006

Publisher

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English:

Conference name

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Conference site

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English: