The Complexity of Fault Testing for Reversible Circuits

Publication Information

Title

Japanese:
English:	The Complexity of Fault Testing for Reversible Circuits

Author

Japanese:	Shigeru Ito, 田湯智, 上野修一.
English:	Shigeru Ito, Satoshi Tayu, Shuichi UENO.

Language

English

Journal/Book name

Japanese:
English:	Proceedings of the 2006 IEICE Society Conference

Volume, Number, Page

No. AS-1-1 pp. S-1 - S-2

Published date

Sept. 2006

Publisher

Japanese:
English:

Conference name

Japanese:
English:	2006 IEICE Society Conference

Conference site

Japanese:
English:	Kanazawa Univ.