Molecular Alignment Studied by X-ray Diffraction Analysis and Optical Properties of Vacuum-Deposited Thin Films of Thiophene-Pyridine Co-Oogomers

Publication Information

Title

Japanese:
English:	Molecular Alignment Studied by X-ray Diffraction Analysis and Optical Properties of Vacuum-Deposited Thin Films of Thiophene-Pyridine Co-Oogomers

Author

Japanese:	A. Kumagai, Y. Fujiwara, H. Fukumoto, S. Sasaki, H. Koinuma, T. Yamamoto.
English:	A. Kumagai, Y. Fujiwara, H. Fukumoto, S. Sasaki, H. Koinuma, T. Yamamoto.

Language

English

Journal/Book name

Japanese:
English:	Jpn. J. Appl. Phys

Volume, Number, Page

Vol. 45 pp. L598-L601

Published date

2006

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: