Comparative Study on Influence of Subband Structures on Electrical Characteristics of III-V Semiconductor, Ge and Si Channel n-MISFETs

Publication Information

Title

Japanese:
English:	Comparative Study on Influence of Subband Structures on Electrical Characteristics of III-V Semiconductor, Ge and Si Channel n-MISFETs

Author

Japanese:	S.Takagi, S.Sugahara.
English:	S.Takagi, S.Sugahara.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

pp. paper H-9-1, pp.1056-1057

Published date

2006

Publisher

Japanese:
English:

Conference name

Japanese:
English:	2006 Intl. Conf. on Solid State Devices and Materials (SSDM 2006), Yokohama, Japan,

Conference site

Japanese:
English: