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Publication Information
Title
Japanese:
English:
Gate Dielectric Formation and MIS Interface Characterization on Ge
Author
Japanese:
S.Takagi, T.Maeda, N.Taoka, M.Nishizawa, Y.Morita, K.Ikeda, Y.Yamashita, M.Nishikawa, H.Kumagai, R.Nakane,
菅原 聡
, N.Sugiyama.
English:
S.Takagi, T.Maeda, N.Taoka, M.Nishizawa, Y.Morita, K.Ikeda, Y.Yamashita, M.Nishikawa, H.Kumagai, R.Nakane,
S.Sugahara
, N.Sugiyama.
Language
English
Journal/Book name
Japanese:
English:
The 15th Biennial Conf. on Insulatring Films on Semiconductors (INFOS2007)
Volume, Number, Page
pp. 2314-2319
Published date
June 2007
Publisher
Japanese:
English:
Conference name
Japanese:
English:
The 15th Biennial Conf. on Insulatring Films on Semiconductors (INFOS2007), Athene, Greece,
Conference site
Japanese:
English:
©2007
Institute of Science Tokyo All rights reserved.