High throughput characterization of magnetic semiconductor thin films with a scanning SQUID microscope

Publication Information

Title

Japanese:
English:	High throughput characterization of magnetic semiconductor thin films with a scanning SQUID microscope

Author

Japanese:	X. J. Fan, M. Murakami, R. Takahashi, T. Koida, Y. Matsumoto, T. Hasegawa, T. Fukumura, M. Kawasaki, P. Ahmet, T. Chikyow, H. Koinuma.
English:	X. J. Fan, M. Murakami, R. Takahashi, T. Koida, Y. Matsumoto, T. Hasegawa, T. Fukumura, M. Kawasaki, P. Ahmet, T. Chikyow, H. Koinuma.

Language

English

Journal/Book name

Japanese:
English:	Mat. Res. Soc. Symp. Proc.

Volume, Number, Page

Vol. 700 pp. 55-60

Published date

2002

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: