Low-Density Triple-Erasure Correcting Codes for Dependable Distributed Storage Systems

Publication Information

Title

Japanese:	Low-Density Triple-Erasure Correcting Codes for Dependable Distributed Storage Systems
English:	Low-Density Triple-Erasure Correcting Codes for Dependable Distributed Storage Systems

Author

Japanese:	Hiroyuki Ohde, 金子晴彦, 藤原英二.
English:	Hiroyuki Ohde, Haruhiko Kaneko, EIJI FUJIWARA.

Language

English

Journal/Book name

Japanese:	Proc. 2006 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
English:	Proc. 2006 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volume, Number, Page

pp. 175-183

Published date

Oct. 2006

Publisher

Japanese:
English:	IEEE

Conference name

Japanese:
English:	IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Conference site

Japanese:
English:	Washington, DC

DOI