A MOS transistor-array for accurate measurement of subthreshold leakage variation

Publication Information

Title

Japanese:
English:	A MOS transistor-array for accurate measurement of subthreshold leakage variation

Author

Japanese:	佐藤高史, 上薗巧, 萩原汐, 岡田健一, 天川修平, 中山範明, 益一哉.
English:	Takashi Sato, Takumi Uezono, Shiho Hagiwara, Kenichi Okada, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

pp. 21-26

Published date

Mar. 2007

Publisher

Japanese:
English:

Conference name

Japanese:
English:	International Symposium on Quality Electronic Design (ISQED)

Conference site

Japanese:
English:	San Jose, California