Defect Descrimination by Narrow Band Eliminating Spatial Filtering Method

Publication Information

Title

Japanese:
English:	Defect Descrimination by Narrow Band Eliminating Spatial Filtering Method

Author

Japanese:	S-H. Jun, A. KObayashi, 大山真司.
English:	S-H. Jun, A. KObayashi, SHINJI OHYAMA.

Language

English

Journal/Book name

Japanese:
English:	Technical Digest of the 11th Sensor Symposium

Volume, Number, Page

pp. 51-54

Published date

1992

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: