High-resolution electron microscopy of microstructure of MnF2 subjected to shock compression at 4.4 GPa

Publication Information

Title

Japanese:
English:	High-resolution electron microscopy of microstructure of MnF2 subjected to shock compression at 4.4 GPa

Author

Japanese:	Kunio Yubuta, 本郷照久, 阿藤敏行, 中村一隆, 近藤建一, Masae Kikuchi.
English:	Kunio Yubuta, Teruhisa Hongo, Toshiyuki Atou, Kazutaka Nakamura, Ken-ichi Kondo, Masae Kikuchi.

Language

English

Journal/Book name

Japanese:
English:	Solid State Communications

Volume, Number, Page

Vol. 143 pp. 127-130

Published date

May 2007

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI