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Publication Information
Title
Japanese:
English:
On the Complexity of Fault Testing for Reversible Circuits
Author
Japanese:
田湯 智
, 伊東 滋,
上野修一
.
English:
Satoshi Tayu
, Shigeru Ito,
Shuichi UENO
.
Language
English
Journal/Book name
Japanese:
English:
Technical Report of IPSJ
Volume, Number, Page
Vol. 2007 No. 66 pp. 25-30
Published date
July 2006
Publisher
Japanese:
情報処理学会
English:
Information Processing Society of Japan
Conference name
Japanese:
English:
Conference site
Japanese:
京都大学
English:
Kyoto University
Official URL
http://www.ipsj.or.jp/sig/al/prog19/prog113.html
©2007
Tokyo Institute of Technology All rights reserved.