On the Complexity of Fault Testing for Reversible Circuits

Publication Information

Title

Japanese:
English:	On the Complexity of Fault Testing for Reversible Circuits

Author

Japanese:	田湯智, 伊東滋, 上野修一.
English:	Satoshi Tayu, Shigeru Ito, Shuichi UENO.

Language

English

Journal/Book name

Japanese:
English:	Technical Report of IPSJ

Volume, Number, Page

Vol. 2007 No. 66 pp. 25-30

Published date

July 2006

Publisher

Japanese:	情報処理学会
English:	Information Processing Society of Japan

Conference name

Japanese:
English:

Conference site

Japanese:	京都大学
English:	Kyoto University

Official URL