On the Fault Testing for Reversible Circuits | Tokyo Tech Research Repository (T2R2)

Publication Information

Title

Japanese:
English:	On the Fault Testing for Reversible Circuits

Author

Japanese:	田湯智, 伊東滋, 上野修一.
English:	Satoshi Tayu, Shigeru Ito, Shuichi UENO.

Language

English

Journal/Book name

Japanese:
English:	Technical Report of the IPSJ

Volume, Number, Page

Vol. 2007 No. 66 pp. 25-30

Published date

July 2007

Publisher

Japanese:
English:

Conference name

Japanese:
English:	情報処理学会アルゴリズム研究会

Conference site

Japanese:	京都大学
English:	Kyoto Univ.

Abstract

null

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