On the Fault Testing for Reversible Circuits

Publication Information

Title

Japanese:
English:	On the Fault Testing for Reversible Circuits

Author

Japanese:	田湯智, 伊東滋, 上野修一.
English:	Satoshi Tayu, Shigeru Ito, Shuichi UENO.

Language

English

Journal/Book name

Japanese:
English:	Lecture Notes in Computer Science

Volume, Number, Page

Vol. 4835 pp. 812-821

Published date

Dec. 2007

Publisher

Japanese:
English:	Springer Verlarg

Conference name

Japanese:
English:	International Computing and Combinatorics Conference

Conference site

Japanese:	仙台
English:	Sendai, Japan

DOI