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Publication Information
Title
Japanese:
English:
Effects of phase-locked-loop circuit on a self-commutated BTB system under line faults
Author
Japanese:
ファムフォン ヴィェト
,
萩原誠
,
赤木泰文
.
English:
Viet Phuong Pham
,
Makoto Hagiwara
,
Hirofumi Akagi
.
Language
English
Journal/Book name
Japanese:
English:
IEEE Power Electronics Specialists Conference, 2008.
Volume, Number, Page
pp. 1708-1714
Published date
June 2008
Publisher
Japanese:
English:
Conference name
Japanese:
English:
Conference site
Japanese:
English:
DOI
https://doi.org/10.1109/PESC.2008.4592188
©2007
Tokyo Institute of Technology All rights reserved.