Effects of phase-locked-loop circuit on a self-commutated BTB system under line faults

Publication Information

Title

Japanese:
English:	Effects of phase-locked-loop circuit on a self-commutated BTB system under line faults

Author

Japanese:	ﾌｧﾑﾌｫﾝｳﾞｨｪﾄ, 萩原誠, 赤木泰文.
English:	Viet Phuong Pham, Makoto Hagiwara, Hirofumi Akagi.

Language

English

Journal/Book name

Japanese:
English:	IEEE Power Electronics Specialists Conference, 2008.

Volume, Number, Page

pp. 1708-1714

Published date

June 2008

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI