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Publication Information
Title
Japanese:
English:
Layout-aware compact model of MOSFET characteristics variations induced by STI stress
Author
Japanese:
Kenta Yamada,
佐藤 高史
,
中山 範明
,
天川 修平
,
益 一哉
.
English:
Kenta Yamada,
Takashi Sato
,
Noriaki Nakayama
,
Shuhei Amakawa
,
Kazuya Masu
.
Language
English
Journal/Book name
Japanese:
English:
IEICE Transactions on Electronics
Volume, Number, Page
Vol. E91-C No. 7 pp. 1142-1150
Published date
July 2008
Publisher
Japanese:
English:
Conference name
Japanese:
English:
Conference site
Japanese:
English:
DOI
https://doi.org/10.1093/ietele/e91-c.7.1142
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Tokyo Institute of Technology All rights reserved.