Non-invasive direct probing for on-chip voltage measurement

Publication Information

Title

Japanese:
English:	Non-invasive direct probing for on-chip voltage measurement

Author

Japanese:	佐藤高史, 山長功, 益一哉.
English:	Takashi Sato, Koh Yamanaga, Kazuya Masu.

Language

English

Journal/Book name

Japanese:
English:	International SoC design conference (ISOCC)

Volume, Number, Page

pp. 350-353

Published date

Nov. 2008

Publisher

Japanese:
English:

Conference name

Japanese:
English:	International SoC design conference (ISOCC)

Conference site

Japanese:
English:	Busan, Korea

DOI