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Publication Information
Title
Japanese:
English:
Non-invasive direct probing for on-chip voltage measurement
Author
Japanese:
佐藤 高史
,
山長 功
,
益 一哉
.
English:
Takashi Sato
,
Koh Yamanaga
,
Kazuya Masu
.
Language
English
Journal/Book name
Japanese:
English:
International SoC design conference (ISOCC)
Volume, Number, Page
pp. 350-353
Published date
Nov. 2008
Publisher
Japanese:
English:
Conference name
Japanese:
English:
International SoC design conference (ISOCC)
Conference site
Japanese:
English:
Busan, Korea
DOI
https://doi.org/10.1109/SOCDC.2008.4815645
©2007
Tokyo Institute of Technology All rights reserved.