A Simple Through-Only De-Embedding Method for On-Wafer S-Parameter Measurements up to 110 GHz

Publication Information

Title

Japanese:
English:	A Simple Through-Only De-Embedding Method for On-Wafer S-Parameter Measurements up to 110 GHz

Author

Japanese:	伊藤浩之, 益一哉.
English:	Hiroyuki Ito, Kazuya Masu.

Language

English

Journal/Book name

Japanese:
English:	IEEE MTT-S International Microwave Symposium2008 (IMS 2008)

Volume, Number, Page

pp. 383-386

Published date

June 2008

Publisher

Japanese:
English:

Conference name

Japanese:
English:	EEE MTT-S International Microwave Symposium2008 (IMS 2008)

Conference site

Japanese:
English:	Atlanta, USA

DOI