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Publication Information
Title
Japanese:
測定系の侵襲性を定量化可能なオンチップ電源電圧変動の直接測定手法
English:
Author
Japanese:
山長功
,
佐藤高史
,
益 一哉
.
English:
Koh Yamanaga
,
Takashi Sato
,
Kazuya Masu
.
Language
Japanese
Journal/Book name
Japanese:
電子情報通信学会総合大会
English:
Volume, Number, Page
pp. C-12-37
Published date
Mar. 2008
Publisher
Japanese:
English:
Conference name
Japanese:
電子情報通信学会総合大会
English:
Conference site
Japanese:
北九州学術研究都市
English:
©2007
Tokyo Institute of Technology All rights reserved.