On Fault Testing for Reversible Circuits

Publication Information

Title

Japanese:	On Fault Testing for Reversible Circuits
English:	On Fault Testing for Reversible Circuits

Author

Japanese:	田湯智, 伊東滋, 上野修一.
English:	Satoshi Tayu, Shigeru Ito, Shuichi UENO.

Language

English

Journal/Book name

Japanese:	電子情報通信学会英語論文誌D
English:	IEICE Trans. Information and Systems

Volume, Number, Page

Vol. E91-D No. 12 pp. 2770-2775

Published date

Dec. 2008

Publisher

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English:

Conference name

Japanese:
English:

Conference site

Japanese:
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DOI