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Publication Information
Title
Japanese:
English:
Fault Testing for Linear Reversible Circuits
Author
Japanese:
福山 翔太
,
田湯 智
,
上野修一
.
English:
Shouta Fukuyama
,
Satoshi Tayu
,
Shuichi UENO
.
Language
English
Journal/Book name
Japanese:
2009年電子情報通信学会総合大会論文集
English:
Proceedings of the 2009 IEICE General Conference
Volume, Number, Page
No. A-1-14
Published date
Mar. 2009
Publisher
Japanese:
電子情報通信学会
English:
Institute of Electronics, Information and Communication Engineers
Conference name
Japanese:
2009年電子情報通信学会総合大会
English:
2009 IEICE General Conference
Conference site
Japanese:
愛媛大学, 松山市
English:
Abstract
null
©2007
Tokyo Institute of Technology All rights reserved.