Bilayer gate dielectric study by scanning tunneling microscopy

Publication Information

Title

Japanese:
English:	Bilayer gate dielectric study by scanning tunneling microscopy

Author

Japanese:	Y.C. Ong, D.S. Ang, K.L. Pey, S.J. O'Shea, K.E.J. Goh, C. Troadec, C.H. Thung, 川那子高暢, 角嶋邦之, 岩井洋.
English:	Y.C. Ong, D.S. Ang, K.L. Pey, S.J. O'Shea, K.E.J. Goh, C. Troadec, C.H. Thung, Takamasa Kawanago, Kuniyuki KAKUSHIMA, HIROSHI IWAI.

Language

English

Journal/Book name

Japanese:
English:	APPLIED PHYSICS LETTERS

Volume, Number, Page

Vol. 91 pp. 102905,

Published date

2007

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI