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Title
Japanese: 
English:Long-Ranged and Short-Ranged Electrostatic Interaction Between Modified Silicon Surfaces and Recombinant Ferritin Molecules 
Author
Japanese: 林智広, 原 正彦.  
English: Tomohiro Hayashi, Masahiko Hara.  
Language English 
Journal/Book name
Japanese: 
English:Japanese Journal of Applied Physics 
Volume, Number, Page     No. 44    pp. 5374-5377
Published date July 2005 
Publisher
Japanese: 
English: 
Conference name
Japanese: 
English: 
Conference site
Japanese: 
English: 
DOI https://doi.org/10.1143/JJAP.44.5374
Abstract Atomic force microscopy (AFM) was employed to probe the interaction between recombinant ferritin molecules immobilized on an AFM tip and surface-modified silicon substrates. Force-distance curve profiles demonstrated for the first time the controllability of long-ranged ferritin-substrate interactions and the amount of ferritin molecules adsorbed on a substrate by modifying the amino acid sequence in the N-terminal domains. In addition, we proposed that the decoration of substrate surface with self-assembled monolayers (SAMs) also helped in controlling the ferritin-substrate interaction and the resulting adsorption amount. Our important finding is that the amount of ferritin adsorbed cannot be predicted simply from the zeta potentials of a ferritin molecule and substrate, and that the flexibility of the surface polar groups on a Si substrate is an important factor that governs the amount of the adsorption. Based on the analysis of force-distance profiles, we discuss what kind of force dominates the long-ranged and short-ranged interactions between ferritin and silicon substrates. These provide insights and lead to a deeper understanding of the factors to govern the adsorption of ferritins onto solid substrates.

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