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Publication Information
Title
Japanese:
English:
On-die parameter extraction from path-delay measurements
Author
Japanese:
高橋 知之
,
上薗 巧
,
新谷 道広
,
益 一哉
,
佐藤 高史
.
English:
Tomoyuki Takahashi
,
Takumi Uezono
,
Michihiro Shintani
,
Kazuya Masu
,
Takashi Sato
.
Language
English
Journal/Book name
Japanese:
English:
2009 IEEE Asian Solid-State Circuits Conference
Volume, Number, Page
pp. 101 - 104
Published date
Nov. 2009
Publisher
Japanese:
English:
IEEE Asian Solid-State Circuits Conference
Conference name
Japanese:
English:
2009 IEEE Asian Solid-State Circuits Conference
Conference site
Japanese:
English:
Taipei, Taiwan
File
DOI
https://doi.org/10.1109/ASSCC.2009.5357189
©2007
Tokyo Institute of Technology All rights reserved.