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Title
Japanese: 
English:Accurate array-based measurement for subthreshold-current of MOS 
Author
Japanese: 佐藤 高史, 植山 寛之, 中山 範明, 益 一哉.  
English: Takashi Sato, Hiroyuki Ueyama, Noriaki Nakayama, Kazuya Masu.  
Language English 
Journal/Book name
Japanese: 
English:IEEE Journal of Solid-State Circuits 
Volume, Number, Page Vol. 44    No. 11    pp. 2977-2986
Published date Nov. 2009 
Publisher
Japanese: 
English:IEEE Journal of Solid-State Circuits 
Conference name
Japanese: 
English: 
Conference site
Japanese: 
English: 
DOI https://doi.org/10.1109/JSSC.2009.2028944

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