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Publication Information
Title
Japanese:
English:
Accurate array-based measurement for subthreshold-current of MOS
Author
Japanese:
佐藤 高史
,
植山 寛之
,
中山 範明
,
益 一哉
.
English:
Takashi Sato
,
Hiroyuki Ueyama
,
Noriaki Nakayama
,
Kazuya Masu
.
Language
English
Journal/Book name
Japanese:
English:
IEEE Journal of Solid-State Circuits
Volume, Number, Page
Vol. 44 No. 11 pp. 2977-2986
Published date
Nov. 2009
Publisher
Japanese:
English:
IEEE Journal of Solid-State Circuits
Conference name
Japanese:
English:
Conference site
Japanese:
English:
DOI
https://doi.org/10.1109/JSSC.2009.2028944
©2007
Tokyo Institute of Technology All rights reserved.