Two-dimensional fringing effects of scaled-down MOS field effect transistors | Science Tokyo Research Repository (T2R2)

Publication Information

Title

Japanese:
English:	Two-dimensional fringing effects of scaled-down MOS field effect transistors

Author

Japanese:	岩井洋.
English:	HIROSHI IWAI.

Type

Type:	Thesis (Ph.D.)
Country:

Language

Organization name

The University of Tokyo

Report number

Conferred date

1992/--/--

Judge

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