Japanese
Home
Search
Horizontal Search
Publication Search
( Advanced Search )
Patent Search
( Advanced Search )
Research Highlight Search
( Advanced Search )
Researcher Search
Search by Organization
Support
FAQ
T2R2 User Registration
Doctoral thesis registration
Support/Contact
About T2R2
What's T2R2?
Operation Guidance
Leaflets
About file disclosure
Related Links
Tokyo Tech
STAR Search
NII IR Program
Home
>
Help
Publication Information
Title
Japanese:
English:
Design and Simulation of Hot-Electron Diffraction Oservation by Scanning Probe – Quantitative Evaluation of Observation Possibility –
Author
Japanese:
西村想
,
古屋一仁
,
宮本恭幸
.
English:
So Nishimura
,
KAZUHITO FURUYA
,
YASUYUKI MIYAMOTO
.
Language
English
Journal/Book name
Japanese:
English:
Jap. J. Appl. Phys.
Volume, Number, Page
vol. 47 no. 9 pp. 8652-8658
Published date
Nov. 2008
Publisher
Japanese:
English:
Conference name
Japanese:
English:
Conference site
Japanese:
English:
©2007
Tokyo Institute of Technology All rights reserved.