Evaluation of collector current spreading of InGaAs SHBT with 75-nm-thick collector

Publication Information

Title

Japanese:
English:	Evaluation of collector current spreading of InGaAs SHBT with 75-nm-thick collector

Author

Japanese:	宮本恭幸, 高橋新之助, 小林嵩, 鈴木裕之, 古屋一仁.
English:	YASUYUKI MIYAMOTO, Shinnosuke Takahashi, Takashi Kobayashi, Hiroyuki Suzuki, KAZUHITO FURUYA.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

June 2009

Publisher

Japanese:
English:

Conference name

Japanese:
English:	2009 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices（AWAD）

Conference site

Japanese:
English:	Busan, Korea