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Publication Information
Title
Japanese:
English:
An Adaptive Test for Parametric Faults Based on Statistical Timing Information
Author
Japanese:
新谷 道広
,
上薗 巧
,
高橋 知之
,
植山 寛之
,
佐藤 高史
,
畠山一実
,
相京 隆
,
益 一哉
.
English:
Michihiro Shintani
,
Takumi Uezono
,
Tomoyuki Takahashi
,
Hiroyuki Ueyama
,
Takashi Sato
,
Kasumi Hatayama
,
Takashi Aikyo
,
Kazuya Masu
.
Language
English
Journal/Book name
Japanese:
English:
IEEE Asian Test Symposium
Volume, Number, Page
pp. 151-156
Published date
Nov. 2009
Publisher
Japanese:
English:
IEEE Asian Test Symposium
Conference name
Japanese:
English:
IEEE Asian Test Symposium
Conference site
Japanese:
English:
Taichung,Taiwan
DOI
https://doi.org/10.1109/ATS.2009.90
©2007
Tokyo Institute of Technology All rights reserved.