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Publication Information
Title
Japanese:
パス遅延測定によるチップ特性の推定手法
English:
Author
Japanese:
高橋知之
,
上薗巧
,
越智裕之
,
益一哉
,
佐藤高史
.
English:
Tomoyuki Takahashi
,
takumi uezono
,
Hiroyuki Ochi
,
Kazuya Masu
,
Takashi Sato
.
Language
Japanese
Journal/Book name
Japanese:
DAシンポジウム
English:
Volume, Number, Page
pp. 133-138
Published date
Aug. 2009
Publisher
Japanese:
DAシンポジウム
English:
Conference name
Japanese:
DAシンポジウム
English:
Conference site
Japanese:
石川県加賀市
English:
©2007
Tokyo Institute of Technology All rights reserved.