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Publication Information
Title
Japanese:
English:
Robust importance sampling for efficient SRAM yield analysis
Author
Japanese:
伊達 貴徳
,
萩原 汐
,
益 一哉
,
佐藤 高史
.
English:
Takanori Date
,
Shiho Hagiwara
,
Kazuya Masu
,
Takashi Sato
.
Language
English
Journal/Book name
Japanese:
English:
International Symposium on Quality Electronic Design (ISQED)
Volume, Number, Page
pp. 15-21
Published date
Mar. 2010
Publisher
Japanese:
English:
International Symposium on Quality Electronic Design (ISQED)
Conference name
Japanese:
English:
International Symposium on Quality Electronic Design (ISQED)
Conference site
Japanese:
English:
San Jose, USA
DOI
https://doi.org/10.1109/ISQED.2010.5450410
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Tokyo Institute of Technology All rights reserved.