Robust importance sampling for efficient SRAM yield analysis

Publication Information

Title

Japanese:
English:	Robust importance sampling for efficient SRAM yield analysis

Author

Japanese:	伊達貴徳, 萩原汐, 益一哉, 佐藤高史.
English:	Takanori Date, Shiho Hagiwara, Kazuya Masu, Takashi Sato.

Language

English

Journal/Book name

Japanese:
English:	International Symposium on Quality Electronic Design (ISQED)

Volume, Number, Page

pp. 15-21

Published date

Mar. 2010

Publisher

Japanese:
English:	International Symposium on Quality Electronic Design (ISQED)

Conference name

Japanese:
English:	International Symposium on Quality Electronic Design (ISQED)

Conference site

Japanese:
English:	San Jose, USA

DOI