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Publication Information
Title
Japanese:
English:
On the validity of bisection-based thru-only de-embedding
Author
Japanese:
関口 貴之
,
天川 修平
,
石原 昇
,
益 一哉
.
English:
Takayuki Sekiguchi
,
Shuhei Amakawa
,
Noboru Ishihara
,
Kazuya Masu
.
Language
English
Journal/Book name
Japanese:
English:
2010 IEEE International Conference on Microelectronic Test Structures (ICMTS2010)
Volume, Number, Page
pp. 66 - 71
Published date
Mar. 2010
Publisher
Japanese:
English:
2010 IEEE International Conference on Microelectronic Test Structures (ICMTS2010)
Conference name
Japanese:
English:
2010 IEEE International Conference on Microelectronic Test Structures (ICMTS2010)
Conference site
Japanese:
English:
Hiroshima, Japan
File
DOI
https://doi.org/10.1109/ICMTS.2010.5466857
©2007
Institute of Science Tokyo All rights reserved.