On the validity of bisection-based thru-only de-embedding

Publication Information

Title

Japanese:
English:	On the validity of bisection-based thru-only de-embedding

Author

Japanese:	関口貴之, 天川修平, 石原昇, 益一哉.
English:	Takayuki Sekiguchi, Shuhei Amakawa, Noboru Ishihara, Kazuya Masu.

Language

English

Journal/Book name

Japanese:
English:	2010 IEEE International Conference on Microelectronic Test Structures (ICMTS2010)

Volume, Number, Page

pp. 66 - 71

Published date

Mar. 2010

Publisher

Japanese:
English:	2010 IEEE International Conference on Microelectronic Test Structures (ICMTS2010)

Conference name

Japanese:
English:	2010 IEEE International Conference on Microelectronic Test Structures (ICMTS2010)

Conference site

Japanese:
English:	Hiroshima, Japan

File

DOI