Automated Tests for Measuring Cognition and Aptitude in Introductory Programming | Tokyo Tech Research Repository (T2R2)

Publication Information

Title

Japanese:
English:	Automated Tests for Measuring Cognition and Aptitude in Introductory Programming

Author

Japanese:	ｱﾊﾞﾝｾﾆｱｴｲﾐｰﾃﾚｯｻｽﾜﾝ, 西原明法.
English:	Aimee Theresa S Avancena, Akinori Nishihara.

Language

English

Journal/Book name

Japanese:
English:	Global Learn 2010

Volume, Number, Page

Published date

May 2010

Publisher

Japanese:
English:	AACE

Conference name

Japanese:
English:	Global Learn 2010

Conference site

Japanese:
English:	Penang

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