Scan Based Process Parameter Estimation Through Path-Delay Inequalities

Publication Information

Title

Japanese:
English:	Scan Based Process Parameter Estimation Through Path-Delay Inequalities

Author

Japanese:	上薗巧, 高橋知之, 新谷道広, Kazumi Hatayama, 益一哉, 越智裕之, 佐藤高史.
English:	Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato.

Language

English

Journal/Book name

Japanese:
English:	IEEE International Symposium on Circuits and Systems (ISCAS 2010)

Volume, Number, Page

Published date

June 2010

Publisher

Japanese:
English:	IEEE International Symposium on Circuits and Systems (ISCAS 2010)

Conference name

Japanese:
English:	IEEE International Symposium on Circuits and Systems (ISCAS 2010)

Conference site

Japanese:
English:	Paris, France

Official URL

DOI