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Title
Japanese: 
English:Analysis on reflection spectra in strained ZnO thin films 
Author
Japanese: 牧野 哲征, 瀬川 勇三朗, 川崎 雅司, 大友 明.  
English: T. Makino, Y. Segawa, M. Kawasaki, A. Ohtomo.  
Language English 
Journal/Book name
Japanese: 
English:Journal of Crystal Growth 
Volume, Number, Page Vol. 287    No. 1    pp. 124-127
Published date Jan. 2006 
Publisher
Japanese: 
English: 
Conference name
Japanese: 
English: 
Conference site
Japanese: 
English: 
Official URL <Go to ISI>://000234982100025
 
DOI https://doi.org/10.1016/j.jcrysgro.2005.10.054
Abstract Thin films of laser molecular-beam epitaxy grown ZnO films were studied with respect to their optical properties. 4-K reflectivity was used to analyze various samples grown at different biaxial in-plane strains. The spectra show two structures at approximate to 3.37 eV corresponding to the A-free exciton transition and at approximate to 3.38 eV corresponding to the B-free exciton transition. Theoretical reflectivity spectra were calculated using the spatial dispersion model. Thus, the transverse energies, the longitudinal transversal splitting (ELT), the oscillator strengths, and the damping parameters were determined for both the A- and B-free excitons of ZnO. As a rough trend, the strain dependence of the energy ELT for the A-excitons is characterized by a negatively peaking behavior with a minimum around the zero strain, while ELT for the B-excitons is an increasing function of the strain field values.

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