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Title
Japanese: 
English:Quantitative conductivity mapping of SrTiO3-LaAlO3-LaTiO3 ternary composition-spread thin film by scanning microwave microscope 
Author
Japanese: 岡崎 壮平, 岡崎 紀明, 廣瀬 靖, 西村 潤, 上野 和紀, 大友 明, 川崎 雅司, 鯉沼 秀臣, 長谷川 哲也.  
English: S. Okazaki, N. Okazaki, Y. Hirose, J. Nishimura, K. Ueno, A. Ohtomo, M. Kawasaki, H. Koinuma, T. Hasegawa.  
Language English 
Journal/Book name
Japanese: 
English:Applied Physics Express 
Volume, Number, Page Vol. 1    No. 5    055003-1-3
Published date Apr. 2008 
Publisher
Japanese: 
English:The Japan Society of Applied Physics 
Conference name
Japanese: 
English: 
Conference site
Japanese: 
English: 
Official URL <Go to ISI>://000256449600021
 
DOI https://doi.org/10.1143/apex.1.055003
Abstract We carried out quantitative mapping of conductivity sigma for the SrTiO3-LaAlO3-LaTiO3 (STO-LAO-LTO) ternary composition-spread thin film by using the scanning microwave microscope (S mu M). The sigma was evaluated from the shifts in Q-value with reference to the standard Ti1-xNxO2 composition-spread thin film. Results for the ternary system showed excellent agreement with the literature values of sigma in the binary STO-LAO and STO-LTO systems, confirming the accuracy of the present analysis method. An electric phase diagram was proposed for the ternary system based on the quantitative film-conductivity data. Metallic conduction in the ternary system was observed in a wide area close to the STO-LTO side, which gave way to the hopping conduction if LAO component exceeded ca. 35%.

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