Home >

news Help

Publication Information


Title
Japanese: 
English:Determination of surface polarity of c-axis oriented ZnO films by coaxial impact-collision ion scattering spectroscopy 
Author
Japanese: 大西 剛, 大友 明, 川崎 雅司, 高橋 和浩, 鯉沼 秀臣.  
English: T. Ohnishi, A. Ohtomo, M. Kawasaki, K. Takahashi, H. Koinuma.  
Language English 
Journal/Book name
Japanese: 
English:Applied Physics Letters 
Volume, Number, Page Vol. 72    No. 7    pp. 824-826
Published date Feb. 1998 
Publisher
Japanese: 
English: 
Conference name
Japanese: 
English: 
Conference site
Japanese: 
English: 
File
Official URL <Go to ISI>://000073126000025
 
DOI https://doi.org/10.1063/1.120905
Abstract We have identified the surface polar structure of wurtzite-type ZnO films by coaxial impact-collision ion scattering spectroscopy. High-quality ZnO epitaxial films were prepared on sapphire (alpha-Al2O3) (0001) substrates by laser molecular beam epitaxy using a ZnO ceramic target. The (000 (1) over bar) crystallographic plane (the O face) was found to terminate the top surface of the ZnO film by comparing spectra of the films with those of well-defined (0001) and (000 (1) over bar) surfaces of bulk single crystals. The preferential [000 (1) over bar] growth direction of ZnO films is discussed from the viewpoints of the chemical interaction at the interface and surface stability against sublimation.

©2007 Tokyo Institute of Technology All rights reserved.