Universal Test Sets for Reversible Circuits | Tokyo Tech Research Repository (T2R2)

Publication Information

Title

Japanese:
English:	Universal Test Sets for Reversible Circuits

Author

Japanese:	田湯智, 上野修一.
English:	Satoshi Tayu, Shuichi UENO.

Language

English

Journal/Book name

Japanese:
English:	Proceedings of the 2009 IEICE Society Conference

Volume, Number, Page

No. A-1-7

Published date

Sept. 2009

Publisher

Japanese:
English:

Conference name

Japanese:
English:	2009 IEICE Society Conference

Conference site

Japanese:
English:	Niigata Univ.

©2007 Tokyo Institute of Technology All rights reserved.