Universal Test Sets for Reversible Circuits

Publication Information

Title

Japanese:
English:	Universal Test Sets for Reversible Circuits

Author

Japanese:	田湯智, Shota Fukuyama, 上野修一.
English:	Satoshi Tayu, Shota Fukuyama, Shuichi UENO.

Language

English

Journal/Book name

Japanese:
English:	Technical Report of the IEICE

Volume, Number, Page

Vol. 109 No. 300 pp. 59-64

Published date

Nov. 2009

Publisher

Japanese:
English:	Institute of Electronics, Information and Communication Engineers

Conference name

Japanese:
English:

Conference site

Japanese:
English:	Nagoya Univ.